Volume : III, Issue : IV, April - 2014
UV– VIS– NIR Spectrophotometer for Nano Particles and Nano– Crystalline Thin Films
Paresh V. Modh
Abstract :
Thin films and nanoparticles now occupy a prominent place in basic research and solid state technology. Semiconductor nanoparticles have been extensively investigated during the last two decade, due to their properties and application. So the properties of the nano particles must be necessary to know from different techniques. For nanoparticles, the size and surface effect both are important. So ultraviolate, visible, near infrared spectrophotometer is helpful in Nano technology
Keywords :
Absorbance Transmittance Absorbance optical length sample concentration Beer’s Law scanning monochromatic light double beam instrument photon
Article:
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DOI : 10.36106/ijsr
Cite This Article:
Paresh V. Modh UV- VIS- NIR Spectrophotometer for Nano
Particles and Nano- Crystalline Thin Films International Journal of Scientific Research, Vol.III, Issue. IV Apr 2014
Number of Downloads : 1067
Paresh V. Modh UV- VIS- NIR Spectrophotometer for Nano Particles and Nano- Crystalline Thin Films International Journal of Scientific Research, Vol.III, Issue. IV Apr 2014
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