Volume : III, Issue : VIII, August - 2014

Testing of Mixed Signal Ics: A Review

Ashish Tiwari

Abstract :

This paper basically gives a review on various testing techniques adopted for the detection of faults in a Mixed signal IC. Charge Pump Phase locked loop i.e. CP-PLL is considered here as mixed signal IC for reviewing all the testing methods adopted over the years. Design for testability, DFT must be a centre element for the design process these days. With circuit complexity increasing and component size decreasing, the testability of electronic circuits are more crucial as testing is becoming even more demanding. This rising popularity increases the demand of prepå the low cost testing circuitry. Because of the tight feedback CP-PLL is one of the difficult electronic circuit to which testing strategy is to be adopted. Here in this paper all the methods are reviewed and a comparison chart is shown having the details of area overhead and efficiency.

Keywords :

Article: Download PDF    DOI : https://www.doi.org/10.36106/gjra  

Cite This Article:

TESTING OF MIXED SIGNAL ICS: A REVIEW, Ashish Tiwari GLOBAL JOURNAL FOR RESEARCH ANALYSIS : Volume-3 | Issue-8 | August-2014

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