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MENUVolume : IV, Issue : X, October - 2015
Effect of Annealing Temperature on Microstructure amd Surface Morphology (AFM) of ZnO Thin Films with Mg Dopant
Dr. Mahendra Kumar
Abstract :
The morphological properties of the thin films were studied with the help of atomic force microscopy (AFM) technique. The films were subsequently annealed in ambient air from 400°C to 500°C. The average grain size ranged from 15 to 27nm. Increasing annealing temperatures resulted in larger grain sizes and higher crystallinity, with the surface roughness of annealed films being more than twice if compared to unannealed film.
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DOI : https://www.doi.org/10.36106/gjra
Cite This Article:
Dr. Mahendra Kumar Effect of Annealing Temperature on Microstructure amd
Surface Morphology (AFM) of ZnO thin films with Mg
dopant Global Journal For Research Analysis, Vol: 4, Issue: 10 October 2015
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Dr. Mahendra Kumar Effect of Annealing Temperature on Microstructure amd Surface Morphology (AFM) of ZnO thin films with Mg dopant Global Journal For Research Analysis, Vol: 4, Issue: 10 October 2015
