Comparative Discussion on Plagiarism Classification and Levenshtein Detection Techniques

Nilesh Channawar; Dr. S.B.Kishor

Volume : VIII, Issue : I, January - 2019

Comparative Discussion on Plagiarism Classification and Levenshtein Detection Techniques

Nilesh Channawar, Dr. S. B. Kishor

Abstract :

Plagiarism is a process of theft of concepts, ideas, words, methodology or results of another person without mentioning the proper acknowledgment, credit or citation. In Plagiarism one person can affirm other work as its own or one can include other hard work as its own without giving the proper citation and credit. Now a day�s Plagiarism is a serious concern happening in research field. This paper, presents a systematic review of Plagiarism concept and reviewing on Levenshtein plagiarism detection technique in various text matching field. Levenshtein distance algorithm is a very efficient plagiarism detection technique. We will highlight on the working process of Levenshtein algorithm in detecting Plagiarism.